SCreate Dala Technology Co., Ltd.

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High Speed Double Laser Micrometer Measurement For Diameter And Defect

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SCreate Dala Technology Co., Ltd.
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Country/Region:china
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High Speed Double Laser Micrometer Measurement For Diameter And Defect

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Brand Name :Screate DALA
Model Number :F2010-K
Certification :CE
Place of Origin :CHINA
MOQ :Negotiable
Price :Negotiable
Payment Terms :T/T, etc.
Delivery Time :7 - 15 working Days
Packaging Details :standard packing, as customer demands
Measurement data :diameter and ovality, lump and necks
Application :electric wire&cable, steel wire ,enamelled copper wire, 3D filament. etc.
Measurement :0.2~10mm
Repeatability :±0.1μm
Accuracy :±(0.0005+0.01%*D)mm
Size :155*140*58mm
Working power source :24V ±10% 40VA
Communication :WIFI,RS485 MODBUS RTU,CAN,PROFINET,PROFIBUS,ETHERNET IP
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View Product Description

Good at Vibrating object measurement , restore object actual status

F2010-k is a high-speed optical laser micrometer based on laser diffraction principle. It is fast enough to provide diameter, lumps and necks measurement in 2-axis.

Sampling frequency can reach to 10KHz due to no motor running speed limitation,which enables to get more information of the object under measurement.
High Speed Double Laser Micrometer Measurement For Diameter And Defect

Single axis sampling frequency of 10 KHz

Sampling frequency can reach to 10KHz due to no motor running speed limitation,which enables to get more information of the object under measurement.

High Speed Double Laser Micrometer Measurement For Diameter And Defect

Extremely short exposure time of 0.5us

Featuring an incredibly short exposure time, F2010-k is good at capturing object images without any blur or shadow, ensuring precise measurement accuracy.

High Speed Double Laser Micrometer Measurement For Diameter And Defect

Applications

High Speed Double Laser Micrometer Measurement For Diameter And Defect

Touch Screen,Computer,Cellphone

DALA F2010-K can be managed by computer ,cellphone and Touch screen,like parameter setting ,measurement data management ,

and so on,customers can choose as their application request.
High Speed Double Laser Micrometer Measurement For Diameter And Defect

Technical Specification

Model F2010-K
Axis 2-axis
Measurement data diameter and ovality, lump and necks
Frequency 10KHz/axis
Measurement range 0.2~10mm
Repeatability(1) ±0.1μm
Accuracy(2) ±(0.0005+0.01%*D)mm
Min defect height 0.01mm
Min defect length(3) 0.2mm(wire speed120m/min)
0.8mm(wire speed500m/min)
Size 155*140*58mm
Working power source 24V ±10% 40VA
Running temperature 5℃~50℃
Display LED display
Commuincation port

Standard:WIFI,RS485 MODBUS RTU,CAN

Option:PROFIBUS,PROFINET, EtherNet/IP,EtherCAT,PI feedback control(4)

Data colletion & analysis available (option DS14 ZT display and control system,DMS1000)
Out-of-tolerance alarm available
Transparent mode available

Note:

(1) set sliding window as 100ms, outside diameter repeatability of φ1mm round rod at measurement center area

(2) set sliding window as 100ms, outside diameter deviation of φ1mm round rod at measurement area

(3)set defect measurement average time as 0ms, the minimum defect length which cannot be missed at the measurable area

(4)PI feedback control is option, but must order at placing order

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